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| Hamamatsu Si photodiodes | ||
| Type | Features | Product examples |
| Si photodiode | These photodiodes feature high sensitivity and low noise, and they are specifically designed for precision photometry and general photometry in the visible range |
*For UV to near infrared range *For visible to near infrared range *For visible range *RGB color sensor *For vacuum ultraviolet (VUV)detection *For monochromatic light detection *For electron beam detection |
| Si PIN photodiode | Si PIN photodiodes deliver high-speed response when operated with a reverse voltage applied and are suitable for use in optical fiber communications, optical disk pickups, etc. |
*Cutoff frequency:10 MHz or more |
| IR-enhanced Si PIN photodiode |
These photodiodes have improved sensitivity in the near infrared region above 900 nm |
*For YAG laser monitoring |
| Multi-element Si photodiode |
Si photodiode arrays consist of multiple elements formed in a linear or two-dimensional arrangement in a single package. These photodiode arrays are used in a wide range of applications such as light position detection and spectrophotometry |
*Segmented photodiode *One-dimensional photodiode array |
| Si photodiode with preamp thermoelectrically cooled Si photodiode |
Si photodiodes with preamp incorporate a photodiode and a preamplifier into the same package, so they are highly immune to external noise and allow compact circuit design. Thermoelectrically cooled types offer drastically improved S/N. |
*For analysis and measurement |
1. Select photodiodes with lower terminal capacitance.
2. Reduce load resistance.
3. Lower terminal capacitance by applying reverse voltage. (Note that dark current increases with increasing reverse voltage.)
Yes, areas (such as gaps between elements) other than the photosensitive area are sensitive to light. That sensitivity does not match the sensitivity of the effective photosensitive area.
Areas other than the photosensitive area are sensitive to light, so light incident there can generate noise signals and delay the response speed. This problem can be eliminated by focusing the light to a small spot so that it does not enter the areas other than the photosensitive area or light-shielding the areas other than the photosensitive area. As an alternative, forming an aluminum light-shielding film or black light-shielding film on the areas other than the photosensitive area on the chip will also solve this problem.
A resistance of several ohms.
The shunt resistance of Hamamatsu photodiodes is given calculated by the following equation from the dark current (ID) measured when 10 mV is applied:
Rsh [Ω]=0.01 [V]/ID [A]
In a wavelength region shorter than the peak sensitivity wavelength, the spectral response has almost no dependence on temperature. In a region longer than the peak sensitivity wavelength, however, it has a positive temperature coefficient.
One factor that determines Si photodiode response speed is "carrier diffusion speed." When detecting long-wavelength light which penetrates into deep sections of Si photodiodes, the effect of the carrier diffusion speed becomes more significant, resulting in a slow response speed. When detecting short-wavelength light, however, the response speed is less affected by the carrier diffusion speed.
The refractive index is n=1.51.
The refractive index is n=1.53.
The refractive index is n=1.53.
The refractive index is n=1.41.
Resin is frequently used to seal photosensors (window adhesion and resin filling). So using a cleaning solvent may cause the resin to swell or melt, and in some cases the solvent may creep inside the package. So using no-clean solder that does not require cleaning after soldering is recommended.
We provide products that support lead-free solder. Soldering methods vary according to the product, so contact our sales office.
The glass and resin sealant on the light input window is easily scratched and damaged. To clean it, wipe gently with a cotton swab (cotton bud) moistened with ethanol. Using the same cotton swab over and over may cause window scratches due to debris or foreign matter on the cotton swab.
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